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• LDR

  01323camoa2200337 u pc3

• 001

  000000332870

• 005

  20120926205710

• 008

  741003s1975 us a b 001 eng

• 010

  ▼a  74022483 //r92

• 015

  ▼a  GB75-16891

• 020

  ▼a  0471790206

• 040

  ▼a  DLC
  ▼c  DLC
  ▼d  m.c.
  ▼d  CHS
  ▼d  UKM

• 049

  ▼a  KMAL
  ▼l  AZ0000056369

• 082

  ▼a  535.33

• 090

  ▼a  535.33
  ▼b  Si1p

• 100

  ▼a  Siegel, Benjamin M.

• 245

  ▼a  Physical aspects of electron microscopy and microbeam analysis/
  ▼d  edited by Benjamin M. Siegel and D. R. Beaman.

• 260

  ▼a  New York:
  ▼b  Wiley,
  ▼c  1975.

• 300

  ▼a  xiii, 474 p.:
  ▼b  ill.;
  ▼c  26 cm.

• 500

  ▼a  Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973.

• 500

  ▼a  "A Wiley biomedical-health publication."

• 504

  ▼a  Includes bibliographical references and index.

• 650

  ▼a  Electron microscopy.

• 650

  ▼a  Microprobe analysis.

• 650

  ▼a  Microchemistry.

• 650

  ▼a  Electron Probe Microanalysis

• 650

  ▼a  Microscopy, Electron

• 653

  ▼a  PHYSICAL
  ▼a  ASPECTS
  ▼a  OF
  ▼a  ELECTRON
  ▼a  MICROSCOPY
  ▼a  AND
  ▼a  MICROBEAM
  ▼a  ANALYSIS

• 700

  ▼a  Beaman, Donald Robert,

• 710

  ▼a  Electron Microscopy Society of America.

• 710

  ▼a  Microbeam Analysis Society.

• 991

  ▼a  단행본

• 090

  ▼a  535.33
  ▼b  Si1p