MARC 닫기
00613nam ac200205 k 4500
000003808721
20220101120000
ta
020615s1982 us 000 eng
▼a 0895203901
▼a 123456
▼c 123456
▼d 211070
▼l WM1544
▼a TN689.2
▼a TN689.2
▼b A325
▼a F W,Wiffen
▼a Advanced Techniques for Characterizing Microstructures/
▼d Wiffen,F W;
▼e Spitznagel,J A
▼a Warrendale:
▼b Metallurgical Society of AIME,
▼c 1982.
▼a 507p.;
▼c 24cm.
▼a ADVANCED
▼a TECHNIQUES
▼a CHARACTERIZING
▼a MICROSTRUCTURES
▼a J A,Spitznagel
▼a 단행본
| 자료유형 : | 단행본 |
|---|---|
| ISBN : | 0895203901 |
| 분류기호 : | TN689.2 |
| 개인저자 : | F W,Wiffen |
| 서명/저자사항 : | Advanced Techniques for Characterizing Microstructures/ Wiffen,F W; Spitznagel,J A |
| 발행사항 : | Warrendale: Metallurgical Society of AIME, 1982. |
| 형태사항 : | 507p.; 24cm. |
| 개인저자 : | J A,Spitznagel |
| 언어 | 영어 |
1 Data Needs
2 Advanced Microscopy
3 Profilometry, Resistivity and Acoustical measurements
4 Surface Techniques
5 Radiation Channeling and Scattering
6 Atomic and Nuclear Interactions
서평쓰기