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00578nam ac200181 k 4500
000003820527
20220101120000
ta
030514s1998 us 000 eng
▼a 123456
▼c 123456
▼d 211070
▼l WM3060
▼a TK7874
▼a TK7874
▼b Y59
▼a Yoon,Heebyung
▼a Fault Detection and Identification Techniques for Embedded Analog Circuits/
▼d Yoon,Heebyung
▼a Georgia:
▼b Georgia Institute of Technology,
▼c 1998.
▼a 175p.;
▼c 30cm.
▼a FAULT
▼a DETECTION
▼a IDENTIFICATION
▼a TECHNIQUES
▼a EMBEDDED
▼a ANALOG CIRCUITS
▼a 단행본
| 자료유형 : | 단행본 |
|---|---|
| 분류기호 : | TK7874 |
| 개인저자 : | Yoon,Heebyung |
| 서명/저자사항 : | Fault Detection and Identification Techniques for Embedded Analog Circuits/ Yoon,Heebyung |
| 발행사항 : | Georgia: Georgia Institute of Technology, 1998. |
| 형태사항 : | 175p.; 30cm. |
| 언어 | 영어 |
1. Introduction
2. Hierarchical statistical inference model for specification-based testing of analog circuits
3. Design of optimal checker circuits for BIST and On-Line error detection in Linear Analog Circuits
4. Fault diagnosis for embedded integrated RF-Passives using sensitivity analysis
5. Fault detection and automated fault diagnosis for embedded integrated passives using Pole/Zero Analysis
6. Conclusions and future work
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