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00738nam ac200205 k 4500
000003850613
20220101120000
ta
040615s1977 ja 000 eng
▼a 0070042306
▼a 123456
▼c 123456
▼d 211070
▼l WM4701
▼a TK7867
▼a TK7867
▼b B36
▼a Becker,Peter W.
▼a Design of Systems and Circuits for Maximum Reliability or Maximum Production Yield/
▼d Becker,Peter W;
▼e Jensen,Finn
▼a Tokyo:
▼b McGraw-Hill Kogakusha, Ltd,
▼c 1977.
▼a 293p.;
▼c 21cm.
▼a Electronic circuit design
▼a Data processing
▼a Electronic apparatus and appliances
▼a Design and construction
▼a Electronic apparatus and appliances
▼a Reliability
▼a Finn,Jensen
▼a 단행본
| 자료유형 : | 단행본 |
|---|---|
| ISBN : | 0070042306 |
| 분류기호 : | TK7867 |
| 개인저자 : | Becker,Peter W. |
| 서명/저자사항 : | Design of Systems and Circuits for Maximum Reliability or Maximum Production Yield/ Becker,Peter W; Jensen,Finn |
| 발행사항 : | Tokyo: McGraw-Hill Kogakusha, Ltd, 1977. |
| 형태사항 : | 293p.; 21cm. |
| 개인저자 : | Finn,Jensen |
| 언어 | 영어 |
WMO200400677
권 호 : 293p.
발행년 : 1977
발행처 : McGraw-Hill Kogakusha, Ltd
서 명 : Design of Systems and Circuits for Maximum Reliability or Maximum Production Yield
목차
1. Introduction
2. Some Basic Reliability Concepts
3. Mathematical Design
4. Mathematical Model of Yield or of Drift Reliability Rd(t)
5. Methods for Computing the Probability of System or Circuit Success
6. Basis for the Prediction of Yield and Drift reliability
7. Examples of Output-Variable Probability Densities Obtained by Convolution and Monte Carlo Techniques
8. Optimization Techniques
9. Circuit Examples Illustrating the Use of the Proposed Design Strategies
Appendixes
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