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00731nam ac200217 k 4500
000000211235
20220101120000
ta
040629s1991 us 000 eng
▼a 0792391659
▼a 123456
▼c 123456
▼d 211070
▼l WM4830
▼a TK7868.L6
▼a TK7868.L6
▼b C44
▼a Chakradhar,Srimat T.
▼a Neural Models and Algorithms for Digital Testing/
▼d Chakradhar,Srimat T;
▼e Agrawal,Vishwani D;
▼e Bushnell,Michael L
▼a Boston:
▼b Kluwer Academic Pub.,
▼c 1991.
▼a 184p.;
▼c 23cm.
▼a Logic circuits
▼a Testing
▼a Automatic checkout equipment
▼a Digital integrated circuits
▼a Data processing
▼a Vishwani D,Agrawal
▼a Michael L ,Bushnell
▼a 단행본
| 자료유형 : | 단행본 |
|---|---|
| ISBN : | 0792391659 |
| 분류기호 : | TK7868.L6 |
| 개인저자 : | Chakradhar,Srimat T. |
| 서명/저자사항 : | Neural Models and Algorithms for Digital Testing/ Chakradhar,Srimat T; Agrawal,Vishwani D; Bushnell,Michael L |
| 발행사항 : | Boston: Kluwer Academic Pub., 1991. |
| 형태사항 : | 184p.; 23cm. |
| 개인저자 : | Vishwani D,Agrawal |
| 개인저자 : | Michael L ,Bushnell |
| 언어 | 영어 |
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