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01492cam a22003851u 45x0
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20120927144535
890925s1993 us a b 101 eng
▼a 0306445719
▼a KMAL
▼l AZ0000164574
▼v 36
▼a 543.08586
▼a 543.08586
▼b Ad9a
▼a Advances in X-ray analysis.
▼n 36/
▼d edited by John V. Gilfrich...[et al.].
▼a New York:
▼b Plenum Press,
▼c c1993.
▼a xxiii, 685 p.:
▼b ill.;
▼c 25 cm.
▼a "Proceedings of the Thirty-seventh Annual Conference on Applications of X-ray Analysis, held August 1-5, 1988, in Steamboat Springs, Colorado"--T.p. verso.
▼a X-rays
▼x Industrial applications
▼x Congresses.
▼a X-ray spectroscopy
▼x Congresses.
▼2 nasat
▼a X RAY ANALYSIS
▼2 nasat
▼a X RAYS
▼2 nasat
▼a INDUSTRIES
▼2 nasat
▼a NONDESTRUCTIVE TESTS
▼2 nasat
▼a MICROBEAMS
▼2 nasat
▼a X RAY IMAGERY
▼2 nasat
▼a IMAGING TECHNIQUES
▼2 nasat
▼a THIN FILMS
▼2 nasat
▼a X RAY FLUORESCENCE
▼2 nasat
▼a X RAY DIFFRACTION
▼2 nasat
▼a X RAY STRESS ANALYSIS
▼2 nasat
▼a SYNCHROTRON RADIATION
▼a ADVANCES
▼a IN
▼a XRAY
▼a ANALYSIS
▼a Gilfrich, John V,
▼a University of Denver.
▼b Dept. of Engineering.
▼a JCPDS--International Centre for Diffraction Data.
▼a Conference on Applications of X-ray Analysis:
▼c Steamboat Springs, Colo.):
▼d 1988
▼n (37th
▼a 단행본
▼a 543.08586
▼b Ad9a
| 자료유형 : | 단행본 |
|---|---|
| ISBN : | 0306445719 |
| 분류기호 : | 543.08586 |
| 서명/저자사항 : | Advances in X-ray analysis. 36/ edited by John V. Gilfrich...[et al.]. |
| 발행사항 : | New York: Plenum Press, c1993. |
| 형태사항 : | xxiii, 685 p.: ill.; 25 cm. |
| 일반주기 : | "Proceedings of the Thirty-seventh Annual Conference on Applications of X-ray Analysis, held August 1-5, 1988, in Steamboat Springs, Colorado"--T.p. verso. |
| 일반주제명 : | X-rays -- Industrial applications -- Congresses. -- |
| 일반주제명 : | X-ray spectroscopy -- Congresses. -- |
| 일반주제명 : | X RAY ANALYSIS -- |
| 일반주제명 : | X RAYS -- |
| 일반주제명 : | INDUSTRIES -- |
| 일반주제명 : | NONDESTRUCTIVE TESTS -- |
| 일반주제명 : | MICROBEAMS -- |
| 일반주제명 : | X RAY IMAGERY -- |
| 일반주제명 : | IMAGING TECHNIQUES -- |
| 일반주제명 : | THIN FILMS -- |
| 일반주제명 : | X RAY FLUORESCENCE -- |
| 일반주제명 : | X RAY DIFFRACTION -- |
| 일반주제명 : | X RAY STRESS ANALYSIS -- |
| 일반주제명 : | SYNCHROTRON RADIATION -- |
| 개인저자 : | Gilfrich, John V, |
| 단체저자명 : | University of Denver. Dept. of Engineering. |
| 단체저자명 : | JCPDS--International Centre for Diffraction Data. |
| 회의명 : | Conference on Applications of X-ray Analysis: Steamboat Springs, Colo.): 1988 (37th |
| 분류기호 : | 543.08586 |
| 언어 | 영어 |
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