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00768nam 2200241 k 4500
000000630762
2051130121000
010522s1984 uk a 001a eng
▼a 0201144034
▼a 248023
▼c 248023
▼l EM88315
▼a 621.3819535
▼2 19
▼a 621.3819535
▼b B472d
▼a Bennetts, R. G.
▼a Design of testable logic circuits/
▼d R.G. Bennetts.
▼a London;.
▼a Reading, Mass.:
▼b Addison-Wesley Pub. Co.,
▼c 1984.
▼a xii,164p.:
▼b ill.;
▼c 25cm.
▼a Microelectronics systems design series
▼a Includes bibliographies and index
▼a DESIGN
▼a TESTABLE
▼a LOGIC
▼a CIRCUITS
▼a MICROELECTRONICS
▼a SYSTEMS
▼b \32000
▼a Logic circuits
▼a Logic circuits
▼x Testing
▼a 단행본
▼a 621.3819535
▼b B472d
| 자료유형 : | 단행본 |
|---|---|
| ISBN : | 0201144034 |
| 분류기호 : | 621.3819535 |
| 개인저자 : | Bennetts, R. G. |
| 서명/저자사항 : | Design of testable logic circuits/ R.G. Bennetts. |
| 발행사항 : | London;. Reading, Mass.: Addison-Wesley Pub. Co., 1984. |
| 형태사항 : | xii,164p.: ill.; 25cm. |
| 총서사항 : | Microelectronics systems design series |
| 서지주기 : | Includes bibliographies and index |
| 분류기호 : | 621.3819535 |
| 언어 | 영어 |
항공우주(航空宇宙) = Monthly aerospace industry
629.13005 항15하
월간항공(月刊航空) = Aerospace & Defense
629.13005 항15
드론매거진 = DRONE MAGAZINE
623.746905 드29ㄷ
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