MARC 닫기

• LDR

  00857nam 2200253 k 4500

• 001

  000000668455

• 005

  2051130121000

• 008

  971017s1996 uk a 001a eng

• 020

  ▼a  0521461960:
  ▼c  ￡37.50

• 040

  ▼a  248023
  ▼c  248023

• 049

  ▼l  EM128928

• 082

  ▼a  621.38152

• 090

  ▼a  621.38152
  ▼b  R315p

• 100

  ▼a  Redfield, David.

• 245

  ▼a  Photoinduced defects in semiconductors/
  ▼d  by David Redfield;
  ▼e  Richard H. Bube.

• 260

  ▼a  Cambridge:
  ▼b  Cambridge university press,
  ▼c  1996.

• 300

  ▼a  x,217p.:
  ▼b  illus.;
  ▼c  24cm.

• 440

  ▼a  Cambridge studies in semiconductor physics and microelectronic engineering;
  ▼v  v.4

• 504

  ▼a  Includes bibliographical references and index

• 653

  ▼a  PHOTOINDUCED
  ▼a  DEFECTS
  ▼a  SEMICONDUCTORS

• 700

  ▼a  Bube, Richard H.,
  ▼e  jt,

• 950

  ▼b  \61400

• 965

  ▼a  Semiconductors-
  ▼x  defects

• 965

  ▼a  Photochemistry

• 991

  ▼a  단행본

• 090

  ▼a  621.38152
  ▼b  R315p