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00866nam 2200229 k 4500
000000650018
2051130121000
990302s1973 us a 000a eng
▼a 248023
▼c 248023
▼l EM94266
▼a 543
▼a 543
▼b A512s
▼a American Society for Testing and Materials
▼a Sampling, standards and homogeneity/
▼d Americna Society for Testing and Materials;
▼e W. R. Kennedy;
▼e J. F. Woodruff.
▼a Philadelphia:
▼b American Society for Testing and Materials,
▼c 1973.
▼a 131p.:
▼b ill.;
▼c 23cm.
▼a ASTM special technical publication;
▼v 540
▼a SAMPLING
▼a STANDARDS
▼a HOMOGENEITY
▼a ASTM
▼a SPECIAL
▼a TECHNICAL
▼a PUBLICATION
▼a Kennedy, W. R.,
▼e ed. by,
▼a Woodruff, J. F.,
▼e jt,
▼a Symplsium on sampling standards and homogeneity
▼d (1972:
▼c Los Angeles)
▼b \
▼a 단행본
▼a 543
▼b A512s
| 자료유형 : | 단행본 |
|---|---|
| 분류기호 : | 543 |
| 단체저자명 : | American Society for Testing and Materials |
| 서명/저자사항 : | Sampling, standards and homogeneity/ Americna Society for Testing and Materials; W. R. Kennedy; J. F. Woodruff. |
| 발행사항 : | Philadelphia: American Society for Testing and Materials, 1973. |
| 형태사항 : | 131p.: ill.; 23cm. |
| 총서사항 : | ASTM special technical publication; 540 |
| 개인저자 : | Kennedy, W. R., ed. by, |
| 개인저자 : | Woodruff, J. F., jt, |
| 회의명 : | Symplsium on sampling standards and homogeneity (1972: Los Angeles) |
| 분류기호 : | 543 |
| 언어 | 영어 |
측량정보공학 = Geomatics engineering / 개정6판
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