MARC 닫기

• LDR

  00961nam 2200253 k 4500

• 001

  000000662548

• 005

  2051130121000

• 008

  970905s1995 us a 001a eng

• 020

  ▼a  0792396952:
  ▼c  Dfl170.00

• 040

  ▼a  248023
  ▼c  248023

• 049

  ▼l  EM128597

• 082

  ▼a  621.3815284

• 090

  ▼a  621.3815284
  ▼b  H126c

• 100

  ▼a  Haddara, Hisham.

• 245

  ▼a  Characterization methods for submicron mosfets/
  ▼d  by Hisham Haddara.

• 260

  ▼a  Boston:
  ▼b  Kluwer academic,
  ▼c  1995.

• 300

  ▼a  ⅶ,232p.:
  ▼b  illus.;
  ▼c  24cm.

• 440

  ▼a  (The)Kluwer international series in engineering and computer science;
  ▼v  SECS 352.
  ▼a  analog circuits and signal processing

• 504

  ▼a  Includes bibliographical references and index

• 653

  ▼a  CHARACTERIZATION
  ▼a  METHODS
  ▼a  SUBMICRON
  ▼a  MOSFETS

• 949

  ▼a  Analog circuits and signal processing

• 950

  ▼b  \85000

• 965

  ▼a  Metal oxide semiconductor field-effect transistors-
  ▼x  mathematical models

• 965

  ▼a  Electronic circuit design

• 991

  ▼a  단행본

• 090

  ▼a  621.3815284
  ▼b  H126c