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• LDR

  01060nam 2200277 k 4500

• 001

  000000670436

• 005

  2051130121000

• 008

  970923s1996 us a 001a eng

• 020

  ▼a  0792397142:
  ▼c  Dfl175.00

• 040

  ▼a  248023
  ▼c  248023

• 049

  ▼l  EM128730

• 082

  ▼a  621.38152

• 090

  ▼a  621.38152
  ▼b  K45f

• 100

  ▼a  Khare, Jitendra B.

• 245

  ▼a  From contamination to defects, faults and yield loss:
  ▼b  simulation and applications/
  ▼d  by Jitendra B. Khare;
  ▼e  Wojciech Maly.

• 260

  ▼a  Boston:
  ▼b  Kluwer academic,
  ▼c  1996.

• 300

  ▼a  150p.:
  ▼b  illus.;
  ▼c  24cm.

• 490

  ▼a  Frontiers in electronic testing

• 504

  ▼a  Includes bibliographical references and index

• 653

  ▼a  FROM
  ▼a  CONTAMINATION
  ▼a  DEFECTS
  ▼a  FAULTS
  ▼a  YIELD
  ▼a  LOSS

• 700

  ▼a  Maly, Wojciech,
  ▼e  jt,

• 950

  ▼b  \87500

• 965

  ▼a  Integrated circuits-
  ▼x  very large scale integration-
  ▼x  testing

• 965

  ▼a  Integrated circuits-
  ▼x  very large scale integration-
  ▼x  defects

• 965

  ▼a  Integrated circuits-
  ▼x  very large scale integration-
  ▼x  computer simulation

• 965

  ▼a  Computer-aided design

• 991

  ▼a  단행본

• 090

  ▼a  621.38152
  ▼b  K45f