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01594camoa2200325 u pc3
000000366074
20120927084408
780928s1978 ne af b 101 eng
▼a 78022081 //r89
▼a 0444851305
▼a DLC
▼c DLC
▼d m.c.
▼a KMAL
▼l AZ0000106921
▼v 1
▼a 620.1127
▼a 620.1127
▼b D56d2
▼a Amelinckx, S.,
▼e ed.
▼a Diffraction and imaging techniques in material science/
▼d editors, S. Amelinckx, R. Gevers, J. Van Landuyt.
▼a 2d, rev. ed.
▼a Amsterdam;.
▼a New York:
▼b North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland,
▼c 1978.
▼a 2 v. (xvii, 847 p., [1] fold. leaf of plates):
▼b ill.;
▼c 23 cm.
▼a Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.
▼a Includes bibliographical references and index.
▼a v. 1. Electron microscopy.
▼a Electron microscopy
▼x Congresses.
▼a Electrons
▼x Diffraction
▼x Congresses.
▼a Imaging systems
▼x Congresses.
▼a DIFFRACTION
▼a AND
▼a IMAGING
▼a TECHNIQUES
▼a IN
▼a MATERIAL
▼a SCIENCE
▼a ELECTRON
▼a MICROSCOPY
▼a Gevers, R,
▼a Landuyt, J. van,
▼a International Summer Course on Material Science:
▼c Antwerp, Belgium)
▼d (1969.
▼t Modern diffraction and imaging techniques in material science.
▼w cn
▼a Electron microscopy.
▼a 단행본
▼a 620.1127
▼b D56d2
| 자료유형 : | 단행본 |
|---|---|
| ISBN : | 0444851305 |
| 분류기호 : | 620.1127 |
| 개인저자 : | Amelinckx, S., ed. |
| 서명/저자사항 : | Diffraction and imaging techniques in material science/ editors, S. Amelinckx, R. Gevers, J. Van Landuyt. |
| 판사항 : | 2d, rev. ed. |
| 발행사항 : | Amsterdam;. New York: North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978. |
| 형태사항 : | 2 v. (xvii, 847 p., [1] fold. leaf of plates): ill.; 23 cm. |
| 일반주기 : | Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science. |
| 서지주기 : | Includes bibliographical references and index. |
| 내용주기 : | v. 1. Electron microscopy. |
| 일반주제명 : | Electron microscopy -- Congresses. -- |
| 일반주제명 : | Electrons -- Diffraction -- Congresses. -- |
| 일반주제명 : | Imaging systems -- Congresses. -- |
| 개인저자 : | Gevers, R, |
| 개인저자 : | Landuyt, J. van, |
| 회의명 : | International Summer Course on Material Science: Antwerp, Belgium) (1969. Modern diffraction and imaging techniques in material science. |
| 분류기호 : | 620.1127 |
| 언어 | 영어 |
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