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• LDR

  01594camoa2200325 u pc3

• 001

  000000306848

• 005

  20120927084408

• 008

  780928s1978 ne af b 101 eng

• 010

  ▼a  78022081 //r89

• 020

  ▼a  0444851305

• 040

  ▼a  DLC
  ▼c  DLC
  ▼d  m.c.

• 049

  ▼a  KMAL
  ▼l  AZ0000106921
  ▼v  1

• 082

  ▼a  620.1127

• 090

  ▼a  620.1127
  ▼b  D56d2

• 100

  ▼a  Amelinckx, S.,
  ▼e  ed.

• 245

  ▼a  Diffraction and imaging techniques in material science/
  ▼d  editors, S. Amelinckx, R. Gevers, J. Van Landuyt.

• 250

  ▼a  2d, rev. ed.

• 260

  ▼a  Amsterdam;.
  ▼a  New York:
  ▼b  North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland,
  ▼c  1978.

• 300

  ▼a  2 v. (xvii, 847 p., [1] fold. leaf of plates):
  ▼b  ill.;
  ▼c  23 cm.

• 500

  ▼a  Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.

• 504

  ▼a  Includes bibliographical references and index.

• 505

  ▼a  v. 1. Electron microscopy.

• 650

  ▼a  Electron microscopy
  ▼x  Congresses.

• 650

  ▼a  Electrons
  ▼x  Diffraction
  ▼x  Congresses.

• 650

  ▼a  Imaging systems
  ▼x  Congresses.

• 653

  ▼a  DIFFRACTION
  ▼a  AND
  ▼a  IMAGING
  ▼a  TECHNIQUES
  ▼a  IN
  ▼a  MATERIAL
  ▼a  SCIENCE
  ▼a  ELECTRON
  ▼a  MICROSCOPY

• 700

  ▼a  Gevers, R,

• 700

  ▼a  Landuyt, J. van,

• 711

  ▼a  International Summer Course on Material Science:
  ▼c  Antwerp, Belgium)
  ▼d  (1969.
  ▼t  Modern diffraction and imaging techniques in material science.
  ▼w  cn

• 740

  ▼a  Electron microscopy.

• 991

  ▼a  단행본

• 090

  ▼a  620.1127
  ▼b  D56d2